Mr. William R. Evans
Tenure: January 2010 - June 2013
|1||M. Perera, B. A. Tom, Y. Miyamoto, M. W. Porambo, L. E. Moore, W. R. Evans, T. Momose and B. J. McCall
"Refractive Index Measurements of Solid Parahydrogen"
Optics Letters (2011), 36, 840-842.
Pre-McCall Group PublicationsWilliam R. Evans, "Investigating Poincaré Reversibility in Approximations to Irreversible Systems Using a Vector Riemann-Hilbert Approach." Masters Project Paper. Department of Mathematics, Brigham Young University, Provo, Utah. December 2007.
William R. Evans, Sarah C. Barton, M. Clemens and David D. Allred, “Understanding DC-Bias Sputtered Thorium Oxide Thin Films Useful in EUV Optics [6317-37],” in: Advances In X-Ray/EUV Optics, Components, And Applications, edited by Ali M. Khounsary, and Christian Morawe, Proceedings of SPIE, 6317, 631711-1 to 8 (2006).
W.R. Evans and D.D. Allred “Determining Indices of Refraction for ThO2 Thin Films Sputtered Under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry” in Thin Solid Films, Vol. 515, Issue 3, 23 November 2006, p. 847-853.
William R. Evans "Determining Optical Constants for ThO2 Thin Films Sputtered Under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry". Undergraduate Thesis. Department of Physics and Astronomy, Brigham Young University, Provo, Utah. December 2005.